The presentation will be conducted in English, with real-time translation and captioning provided in English, Traditional Chinese and Korean.
此次演講將以英語進行，但同時會有中文和韓語的即時翻譯和字幕可供選擇。
이번 웨비나는 영어로 진행되며, 실시간 중국어 및 한국어 자막이 제공됩니다.
How to achieve great results of AFM and PFM using Single Frequency Vertical Piezoresponse Force Microscopy on highest resolution fast scanning AFMs.
Piezoresponse Force Microscopy (PFM) measures the mechanical response of a piezoelectric or ferroelectric sample when an electrical voltage is applied to the surface with a conductive AFM tip. In response to the electrical stimulus, the sample then locally expands or contracts.
These measurements are critical for understanding the nanoscale properties and behavior of a wide class of functional materials. Asylum Research’s Advanced PFM Modes enable characterization of a variety of materials and devices that previously could not be measured using conventional PFM.
We welcome you to join our PFM Tutorial for Beginners to learn about “Single Frequency Vertical PFM” from invited speaker Prof. Seungbum HONG of KAIST!
Key learning objectives:
Our experts will be addressing to your questions during the webinar, feel free to submit the questions you have!