This on-demand content is available with English, Korean, and Traditional Chinese closed captions.

How to achieve great results of AFM and PFM using Single Frequency Vertical Piezoresponse Force Microscopy on highest resolution fast scanning AFMs.

Piezoresponse Force Microscopy (PFM) measures the mechanical response of a piezoelectric or ferroelectric sample when an electrical voltage is applied to the surface with a conductive AFM tip. In response to the electrical stimulus, the sample then locally expands or contracts. 

These measurements are critical for understanding the nanoscale properties and behavior of a wide class of functional materials. Asylum Research’s Advanced PFM Modes enable characterization of a variety of materials and devices that previously could not be measured using conventional PFM. 

We welcome you to join our PFM Tutorial for Beginners to learn about “Single Frequency Vertical PFM” from invited speaker Prof. Seungbum HONG of KAIST!

Key learning objectives: 

• Basic theory of AFM technique
• Single Frequency Vertical PFM
• High-resolution field effect sensing of Ferroelectric Charges
• Applications of PFM images and piezoresponse hysteresis loops

Our experts will be addressing to your questions during the webinar, feel free to submit the questions you have!