Traditional CV/IV measurement solutions often struggle to keep up with evolving test requirements and increasing throughput demands. The NI PXIe-4190 LCR meter and SMU is a first-of-a-kind instrument with fF-class capacitance measurements and fA-class current measurements in a single, ultracompact instrument optimized for speed that removes the need for switching connections at the device under test. During this session, we will review common applications, discuss techniques used to compensate for parasitics, and provide a measurement demonstration using both interactive and automated software options. _1660217432997