Root Cause Deconvolution - The Next Step in Diagnosis Resolution Improvement
May 27, 2014 === === Scan logic diagnosis turns failing test cycles into valuable data and is an established method for digital semiconductor defect localization. The advent of layout-aware scan diagnosis represented a dramatic advance in diagnosis technology because it reduces suspect area by up to 85% and identifies physical net segments rather than entire logic nets. The defect classifications provided by layout-aware diagnosis make diagnosis an effective tool not just for localization of defects but also for yield analysis.

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