Improving Design Reliability by Avoiding EOS
September 12, 2013 === === With the advent of more complex design requirements and greater variability in operating environments, electrical overstress (EOS) is one of the leading causes of IC failures across all semiconductor manufacturers, and is responsible for the vast majority of device failures and product returns. Learn how Calibre PERC can help you: • Understand voltages at the pin level without SPICE simulation • Avoid EOS and identify oxide-breakdown conditions • Improve reliability and reduce verification time

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