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Addressing Functional Safety in SoCs with Test Solutions
Web event: Addressing Functional Safety in SoCs with Test Solutions
Date: October 10, 2017
Time:09:00 AM PDT
Duration: 60 minutes

As cars integrate more electronics to control safety-critical components, the SoCs within the system must routinely perform in-field self-test to detect structural defects due to aging as well as comply with ISO 26262. These self-tests must execute at power-up and on-the-fly, out in the field during regular operation. To address these challenges, Bosch is integrating multiple Synopsys test solutions, including ECC mechanisms and built-in self-test (BIST) to detect structural hardware faults.

This webinar will describe:
  • Relevance of functional safety to the automotive market
  • Synopsys Memory BIST and Interface IP Test solutions to address Automotive safety requirements in SoCs
  • Bosch’s approach and results in leveraging Synopsys DesignWare® STAR Memory Solution® (SMS), STAR Hierarchical Solution (SHS) and DFTMAX LogicBIST

Speakers:

Yervant Zorian
Fellow & Chief Architect, Synopsys

Dr. Zorian is a Chief Architect and Fellow at Synopsys. Formerly, he was a Distinguished Member of Technical Staff AT&T Bell Laboratories, Vice President and Chief Scientist of Virage Logic, and Chief Technologist at LogicVision. He is currently the President of IEEE Test Technology Technical Council (TTTC), the founder and chair of the IEEE 1500 Standardization Working Group, the Editor-in-Chief Emeritus of the IEEE Design and Test of Computers and an Adjunct Professor at University of British Columbia. He served on the Board of Governors of Computer Society and CEDA, was the Vice President of IEEE Computer Society, and the General Chair of the 50th Design Automation Conference (DAC) and several other symposia and workshops. He received an MS degree in Computer Engineering from University of Southern California, a PhD in Electrical Engineering from McGill University, and an MBA from Wharton School of Business, University of Pennsylvania.


Christophe Eychenne
DFT Architect, Bosch

Christophe Eychenne is DFT architect at Bosch in France. He has worked for more than 20 years in the semiconductor industry, first as an ASIC designer at MBD.A missile system, and later as a DFT architect and team leader at NXP, ST Ericsson and STMicroelectronics. At Bosch, a major focus for Christophe is the development of test methodologies to ensure functional safety in automotive ICs. He graduated from the Polytechnic University School of Montpellier with an MS in microelectronics engineering.



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