Protect Your Device Against Power-Related Damage During Test


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Protect Your Device Against Power-Related Damage During Test

Why this Webcast is important:
In order to meet your schedule, budget, and delivery goals, it is imperative to safeguard your device against damage during test, not only for high-value aerospace/defense and automotive devices, but for low cost devices as well, where high yield is all-important for meeting goals. When the risk of damage is of significant concern, test planning should include a strategy and equipment that minimizes such risk.

The types of potential power-related damages that can occur during test and how protection features integrated into system DC power supplies work to safeguard your DUT, as well what to realistically expect when put into practice, are discussed in depth. This not only includes all the permeations of voltage and current protection mechanisms that exist, but a myriad of other capabilities available to you as well. Understanding and taking advantage of these protection features is ultimately your best line of defense in meeting all your goals!

Who Should View this Webcast:
Engineers performing tests in development, design validation, and manufacturing where meeting schedule, budget, and delivery goals are critical.

Our Presenter:

	Ed Brorein Application Specialist Keysight Technologies

Ed received his BSEE from Villanova University in 1979 and an MSEE from the New Jersey Institute of Technology in 1987. Ed joined Agilent Technologies (at the time Hewlett Packard) in 1979 and worked as an R&D engineer, manufacturing engineer, and marketing engineer in many various roles, presently as an marketing applications engineer, helping customers using power products both in manufacturing and R&D. All along Ed has been actively and deeply involved with the design, engineering, and application of DC power products for testing of electronic devices and product.