Tech Insider: Real-time EMC/EMI testing using Very-Near-Field Methods

Thursday, 4 September 2014 • 2:00 PM EDT, 11:00 AM PT, 18:00 UTC/GMT

Very-Near-Field testing of emissions can be done in seconds using a unique array of probes. These very-near-field “emissions maps” can be used to identify source of emissions and coupling paths to aid in debugging problems early in the design cycle lowering the risk of compliance issue at the qualification stage. The emissions maps can be even used to predict the EMC chamber results at a board level, reducing the need to go to a chamber during development. The excellent sensitivity and high resolution of the emission maps is useful in detecting self-interference problems and highlighting root causes down to a pin level. This seminar will show how the distributed array works and discuss using very-near-field measurements to solve emissions problems. Practical tips and a demonstration of an actual “real-time” EMxpert will be shown.

Who Should Attend:

  • Hardware Engineers
  • PCB designers
  • EMC Engineers
  • Test Engineers

This webinar is intended for engineers or technicians who are facing EMI and EMC issues in a pre- and post-compliance environment. In depth knowledge or EMC principles is not required to get a benefit from this seminar.

 
SPEAKER: Ruska Patton M.Sc., Director of Product Management
Ruska Patton is responsible for the evolution of EMSCAN's real-time near-field measurement solutions. He has a comprehensive understanding of general EMC, EMI and RF design and troubleshooting, with excellent skills in related software applications and programming. Mr. Patton holds both a B.Sc. and M.Sc. in Electrical Engineering from the University of Saskatchewan. During his time at University, he was recognized with numerous IEEE awards and a distinguished research scholarship.
   
MODERATOR: Dexter Johnson
Dexter Johnson is the author of IEEE Spectrum’s online blog The Nanoclast. He has researched and written reports and analysis in the areas of nanotechnology, sensors, IT, advanced manufacturing and economic trends within a number of different industries. He has been the program director for international conferences in the areas of telecommunications, digital content delivery and nanotechnology. In addition to his work at IEEE Spectrum, Dexter is a senior analyst with Cientifica, a UK-based business intelligence company for emerging technologies.
 
 
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