OVERVIEW


The new Agilent 5100 ICP-OES revolutionizes ICP-OES analysis. It is designed to run your samples faster, using less gas, without compromising performance on your toughest samples.

With more than 20 years of supplying ICP-OES to the market, Agilent’s philosophy has always been to supply the fastest, highest performance ICP-OES systems capable of running your toughest samples. Robustness, stability, and reliability have always been a key focus for ICP-OES systems — but there have been some compromises.

The 5100 ICP-OES features a vertical torch and delivers the robustness that you expect from a vertical plasma (‘radial’) ICP-OES, with the sensitivity of an axially viewed ICP-OES. It gives you the flexibility of dual view, without the compromise in robustness of a horizontal torch. Not only that, it also addresses the other compromise in dual view analysis — reduced speed due to sequential measurement of axial and radial views. Using unique Dichroic Spectral Combiner (DSC) technology, the 5100 Synchronous Vertical Dual View (SVDV) system now allows you to measure axial and radial views at the same time, saving you time and money.

The 5100 ICP-OES Synchronous Vertical Dual View (SVDV) heralds a new standard of speed, performance, and simplicity. This presentation outlines the new technology and illustrates its performance on environmental and food sample types.

SPEAKERS




Ross Ashdown
Product Manager MP-AES and ICP-OES
Agilent Technologies





Moderator
Kristen Moore

Multimedia Producer
Spectroscopy


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