 |
|
Reliability Solutions of Flash Products and SSDs ATP’s Reliability & PowerProtector
On-demand webcast: Aired live: May 21, 2014 02:00 PM EDT |
||
 Due to the increased density with each new Flash generation, problems such as limited program/erase cycles, read cycles and data retention are becoming more apparent, requiring more advanced NAND Flash reliability solutions. ATP will discuss major reliability concerns resulted from the inherent nature of Flash products, and how ATP’s reliability solutions can help extend the longevity and product life cycle of ATP flash products. Speaker: Alex Tseng, Engineering Director, ATP Alex Te-chang Tseng is responsible for new product/technology planning at ATP Electronics. He has over 15 years of experience in the Semiconductor/Flash Memory field and, has secured 22 patents in the US, Japan and Taiwan pertaining to semiconductor/design and controller system fields. Alex is a Ph. D candidate in Electrical/Electronics at NCTU, Taiwan. He has authored “NAND Flash Memory”, published in 2009 and is the vice chair of the SSD Alliance Taiwan. Moderator: John McHale, OpenSystems Media |
||
 |