High Speed AFM-Raman Optimized for Nanoscale Chemical Imaging: Making TERS An Accessible Technique

Recorded on November 12, 2013 at 11:00 AM EST.


Scanning Probe Microscopy (SPM) and in particular Atomic Force Microscopy (AFM) allow imaging of physical properties at the nanoscale, while vibrational spectroscopy, especially Raman spectroscopy, enables chemical imaging with diffraction limited resolution.

Taking advantage of surface plasmon resonance, tip-enhanced Raman spectroscopy (TERS) combines the technologies of scanning probe microscopy (SPM) and Raman spectroscopy to provide deep subdiffraction limit mapping of chemical properties, precisely correlated with measurements of other properties such as topography, surface potential, and conductivity. This makes it possible to obtain label-free chemical imaging resolution around 10 nm.

Many solutions exist to combine commercial SPM and spectroscopy systems, but the technique suffers from a reputation of being very complex. Addressing the challenges of such integration through several years of active collaboration, Horiba and AIST-NT are now able to demonstrate that AFM-Raman imaging can be performed routinely, simultaneously, and without compromises, bringing TERS within reach of most researchers.

In this seminar, we will discuss:
• How ultrafast and simultaneous SPM and hyperspectral imaging (AFM-Raman) enables selection of nanoparticles for individual characterization, isolation or directed synthesis.
• How this technique also enables correlation of morphological and chemical properties
• The complete integration of SPM and optical spectroscopy without compromises.
• The use of high performance AFM, STM, and tuning fork modes with high throughput Raman, and other spectroscopy techniques


Moderator:

Laura Bush

Editorial Director
Spectroscopy Magazine

Speakers:

Emmanuel Leroy

AFM-Raman Product Manager
HORIBA Scientific

Andrey Krayev
Chief Technology Officer
AIST-NT


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