Logo


Advances in TERS Applications

Sponsored by Bruker

Event Date: September 27, 2012
Time: 11:00 a.m. EDT / 10:00 a.m. CDT / 8:00 a.m. PDT / 15:00 GMT

Overview:

Atomic Force Microscopy as well as Raman Spectroscopy have become indispensable tools in many areas of science and technology. PeakForce Tapping allows the AFM to measure nano-mechanical properties with true atomic resolution but has a gap in that it lacks chemical specificity. Confocal Raman spectroscopy on the other hand fills this gap but has the shortcoming of being a diffraction limited technique. That gap is addressed by Tip Enhanced Raman Scattering. We will discuss the origin of the technique as well as setups and selected application examples.
Featured Speaker:

Stefan Kaemmer, Application Scientist, Nano Surfaces Division, Bruker

Moderator:

Elizabeth K. Wilson, Senior Editor, C&EN


 If you have previously registered for this event, please login below:
 Email
 LOGIN

Registration is required to attend this event. Please register now.
First Name*
Last Name*
Company*
Job Title*
Address 1*
Address 2
City*
State*
Zipcode*
Country*
Email*
Confirm Email address*
Phone
How did you hear about the webinar?*
If other, please specify:
Are you an ACS member?*
Are you looking to purchase an AFM or AFM-Raman?*
If so, when?
You must have Javascript and Cookies enabled to access this webcast. Click here for Help.
 
Please enable Cookies in your browser before registering for the webcast.
 
*Denotes required.
 
REGISTER