Advances in TERS Applications

Sponsored by Bruker

Event Date: September 27, 2012
Time: 11:00 a.m. EDT / 10:00 a.m. CDT / 8:00 a.m. PDT / 15:00 GMT


Atomic Force Microscopy as well as Raman Spectroscopy have become indispensable tools in many areas of science and technology. PeakForce Tapping allows the AFM to measure nano-mechanical properties with true atomic resolution but has a gap in that it lacks chemical specificity. Confocal Raman spectroscopy on the other hand fills this gap but has the shortcoming of being a diffraction limited technique. That gap is addressed by Tip Enhanced Raman Scattering. We will discuss the origin of the technique as well as setups and selected application examples.
Featured Speaker:

Stefan Kaemmer, Application Scientist, Nano Surfaces Division, Bruker


Elizabeth K. Wilson, Senior Editor, C&EN

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